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IEEE 716-1989

IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

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IEEE 716-1989

IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

PUBLISH DATE 1994

PAGES 439

IEEE 716-1989

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New IEEE Standard - Superseded. Superseded by 716-1995. Common ATLAS (C/ATLAS), a high-order language for testing is defined. C/ATLAS is designed to describe tests in terms that are independent of any specific test system. It has been constrained to ensure that it can be implemented on automatic test equipment.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	716
Publication Date	Nov. 30, 1994
Language	en - English
Page Count	439
Revision Level
Supercedes
Committee	SCC20 - Test and Diagnosis for Electronic Systems

Publish Date	Document Id	Type
June 14, 1995	716-1995	Revision
Nov. 30, 1994	716-1989	Revision
Sept. 30, 1985	716-1985	Revision

SDO	Document	Title
IEC	IEC 61926-1	Design automation - Part 1: Standard test language for all systems - Common abbreviated test language for all systems (C/ATLAS)
BSI	BS EN 61926-1	Design automation. Standard test language for all systems. Common abbreviated test language for all systems (C/ATLAS)
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	IEEE 416	IEEE Standard ATLAS Test Language
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE	IEEE 1671.1	IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
IEEE	IEEE 1671.4	IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
IEEE	IEEE 1671	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE	IEEE 1671.3	IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE	IEEE 1505.1	IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE	IEEE 1076/INT	IEEE Standards Interpretations: IEEE Std 1076-1987, IEEE Standard VHDL Language Reference Manual
IEEE	IEEE 802.16/Conformance02	IEEE Standard for Conformance to IEEE Standard 802.16 - Part 2: Test Suite Structure and Test Purposes (TSS&TP) for 10-66 GHz WirelessMAN-SC Air Interface
IEEE	IEEE 1900.5	IEEE Standard for Policy Language Requirements and System Architectures for Dynamic Spectrum Access Systems
IEEE	IEEE C37.100.2	IEEE Standard for Common Requirements for Testing of AC Capacitive Current Switching Devices over 1000 V
IEEE	IEEE 993	IEEE Standard for Test Equipment Description Language (TEDL)
IEEE	IEEE 1328	IEEE Standard for Information Technology--Test Methods for Measuring Conformance to Open Systems Interconnection (OSI) Abstract Data Manipulation C Language Interfaces--Binding for Application Program Interface (API)
IEEE	IEEE 1671.2	IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE	IEEE 106	IEEE Standard Test procedure for Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
IEEE	IEEE 1653.4	IEEE Standard for DC Traction Power System Field Testing and Acceptance Criteria for System Applications up to 1500 V DC Nominal
IEEE	IEEE 829	IEEE Standard for Software and System Test Documentation
IEEE	IEEE 1666	IEEE Standard for Standard SystemC Language Reference Manual
IEEE	IEEE 117	IEEE Standard Test Procedure for Thermal Evaluation of Systems of Insulating Materials for Random-Wound AC Electric Machinery
IEEE	IEEE 660	IEEE Standard for Semiconductor Memory Test Pattern Language

IEEE 716-1989

IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

IEEE 716-1989

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