Logo
Login Sign Up
Current Revision

IEEE 716-1995

IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
Best Price Guarantee
Instant

$251.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
Institute of Electrical and Electronics Engineers Logo

IEEE 716-1995

IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

PUBLISH DATE 1995
PAGES 594
IEEE 716-1995
Revision Standard - Inactive-Reserved. A high order language for testing is defined. This language is designed to describe tests in terms that are independent of any specific test system, and has been constrained to ensure that it can be implemented on automatic test equipment.
IEEE Std 716-1995 defines a high order language for testing. This language is designed to describe tests in terms that are independent of any specific test system. It has been constrained to ensure that it can be implemented on automatic test equipment. This document defines an operational standard that was originally based upon the language defined by the reference document for the ATLAS language, IEEE Std 416-1984, in that, for those cases where a capability was required that went beyond the existing reference document and working papers, or it was not possible to conveniently subset the 416 material, extensions were developed for IEEE Standard 716.
SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 716
Publication Date June 14, 1995
Language en - English
Page Count 606
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Loading...

Failed to load document history.

Publish Date Document Id Type View