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IEEE 1505.1-2019

Current Revision
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Best Price Guarantee Published: Aug 20, 2019 en - English 158 Pages
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

PUBLISH DATE 2019
PAGES 158
Revision Standard - Active. An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505(TM) receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
The purpose of this standard is to permit the physical interoperability of IEEE 1505-compliant interface fixtures (also known as interface test adapters, interface devices, or interconnecting devices) on multiple ATE systems utilizing the IEEE 1505 RFI by providing a standardized physical pin map with related connector configuration and contact performance characteristics.

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