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IEEE 660-1986

IEEE Standard for Semiconductor Memory Test Pattern Language

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IEEE 660-1986

IEEE Standard for Semiconductor Memory Test Pattern Language

PUBLISH DATE 1986

PAGES 14

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New IEEE Standard - Inactive-Withdrawn.

The scope of this standard is the definition of a descriptive language, including vocabulary and grammar, to describe functional test sequences (also called patterns) for memory devices.

The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive language rather than one for programming a tester. As a result, the grammar and syntax are defined in a looser and more general way than would be required for a programming language. Rigorous Backus-Naur Form (BNF) descriptions are not included.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	660
Publication Date	Feb. 18, 1986
Language	en - English
Page Count	14
Revision Level
Supercedes
Committee	Test Technology

Publish Date	Document Id	Type	View
Feb. 18, 1986	660-1986	Revision

SDO	Document	Title
IEEE	IEEE 716	IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE	IEEE 1450.6.2	IEEE Standard for Memory Modeling in Core Test Language
IEEE	IEEE 1671.4	IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
IEEE	IEEE 1671.1	IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
IEEE	IEEE 1671	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE	IEEE 1671.3	IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE	IEEE 1076/INT	IEEE Standards Interpretations: IEEE Std 1076-1987, IEEE Standard VHDL Language Reference Manual
IEEE	IEEE 416	IEEE Standard ATLAS Test Language
IEEE	IEEE 759	IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
IEEE	IEEE 802.16/Conformance02	IEEE Standard for Conformance to IEEE Standard 802.16 - Part 2: Test Suite Structure and Test Purposes (TSS&TP) for 10-66 GHz WirelessMAN-SC Air Interface
IEEE	IEEE 662	IEEE Standard Terminology for Semiconductor Memory
IEEE	ANSI/IEEE 300	IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
IEEE	IEEE 993	IEEE Standard for Test Equipment Description Language (TEDL)
IEEE	IEEE C62.35	IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
IEEE	IEEE 300	USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
IEEE	IEEE 1671.2	IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE	IEEE 106	IEEE Standard Test procedure for Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
IEEE	IEEE 1666	IEEE Standard for Standard SystemC Language Reference Manual
IEEE	IEEE/IEC 62526	IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
IEEE	IEEE 1901.1.1	IEEE Standard Test Procedures for IEEE Std 1901.1(TM) for Medium Frequency (less than 15 MHz) Power Line Communications for Smart Grid Applications

IEEE 660-1986

IEEE Standard for Semiconductor Memory Test Pattern Language

IEEE 660-1986

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