Current Revision

IEEE 167A.1-1995

IEEE Standard Facsimile Test Chart: Bi-level (Black & White)

Secure PDF

$95.00

Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00

I have read and agree to the Terms & Conditions

IEEE 167A.1-1995

IEEE Standard Facsimile Test Chart: Bi-level (Black & White)

PUBLISH DATE 1995

PAGES 12

Document Preview

Document Information

Revision Standard - Inactive-Withdrawn. A facsimile test chart for assessing performance of document facsimile systems, including any compatible combination of facsimile equipment, computers, transmission facilities, and image storage, is provided. The chart is composed solely of high-resolution, high contrast black-and-white patterns. Although the chart is designed for Group 3 and Group 4 facsimile, it is also expected to be useful in testing other imaging systems. The received image may be recorded or displayed. This standard offers a means of assessing various technical quality parameters, detecting defects produced in received images, and evaluating the readability of text when the original is black and white.

Facsimile test chart for bi-level (black & white).

Provide a bi-level (black & white) facsimile test chart for use in determining the performance of facsimile equipment and systems


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	167A.1
Publication Date	Dec. 29, 1995
Language	en - English
Page Count	12
Revision Level
Supercedes
Committee	Transmission Access & Optical Systems

Publish Date	Document Id	Type	View
Dec. 29, 1995	167A.1-1995	Revision

SDO	Document	Title
IEEE	IEEE 167A.2	IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 167A	IEEE Facsimile Test Chart
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 802.16/Conformance02	IEEE Standard for Conformance to IEEE Standard 802.16 - Part 2: Test Suite Structure and Test Purposes (TSS&TP) for 10-66 GHz WirelessMAN-SC Air Interface
IEEE	IEEE 106	IEEE Standard Test procedure for Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
BSI	BS EN 16465	Plastics. Methods for the calibration of black-standard and white-standard thermometers and black-panel and white-panel thermometers for use in natural and artificial weathering
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	IEEE 1901.1.1	IEEE Standard Test Procedures for IEEE Std 1901.1(TM) for Medium Frequency (less than 15 MHz) Power Line Communications for Smart Grid Applications
IEEE	IEEE 716	IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE	IEEE 802.16/Conformance03	IEEE Standard for Conformance to IEEE Standard 802.16 - Part 3: Radio Conformance Tests (RCT) for 10-66 GHz WirelessMAN-SC Air Interface
IEEE	IEEE 1671.1	IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
IEEE	IEEE 1671.4	IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
IEEE	IEEE 1076/INT	IEEE Standards Interpretations: IEEE Std 1076-1987, IEEE Standard VHDL Language Reference Manual
IEEE	IEEE C37.30.4	IEEE Standard for Test Code for Switching and Fault Making Tests for High-Voltage Interrupter Switches, Interrupters or Interrupting Aids Used on or Attached to Switches Rated for Alternating Currents Above 1000 V
IEEE	IEEE 1802.3	IEEE Conformance Test Methodology for IEEE Standards for Local and Metropolitan Area Networks - Specific Requirements - Part 3: Carrier Sense Multiple Access With Collision Detection (CSMA/CD) Access Method and Physical Layer Specifications
IEEE	IEEE 1671	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE	IEEE 1671.3	IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE	IEEE 1505.1	IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE	IEEE 1717	IEEE Standard for Testing Circuit Integrity Cables Using a Hydrocarbon Pool Fire Test Protocol
IEEE	IEEE C37.34e	IEEE Standard Test Code for High-Voltage Air Switches (Supplement: Switching-Impulse Testing of Extra-High voltage Switches)
IEEE	IEEE 1844	IEEE Standard Test Procedure for Determining Circuit Integrity Performance of Fire Resistive Cables in Nuclear Facilities
IEEE	IEEE 114	IEEE Standard Test Procedure for Single-Phase Induction Motors

IEEE 167A.1-1995

IEEE Standard Facsimile Test Chart: Bi-level (Black & White)

IEEE 167A.1-1995

Document Information

Terms of Service

Conditions of Use

Privacy Policy

Copyright

Communications

Privacy Policy

We use cookies

Manage Cookie Preferences

Essential Cookies Required (3 cookies)

Performance Cookies (2 cookies)