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ISO/TR 18392:2005

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
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ISO/TR 18392:2005

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds

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ISO/TR 18392:2005 gives guidance for determining backgrounds in X-ray photoelectron spectra. The methods of background determination described are applicable for evaluation of spectra of photoelectrons and Auger electrons excited by X-rays from solid surfaces.

SDO ISO: International Organization for Standardization
Document Number ISO/TR 18392
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 201/SC 5
Publish Date Document Id Type View
Not Available ISO/TR 18392:2005 Revision