ISO 13424:2013

Current Revision
Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis

Best Price Guarantee English 1 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Organization for Standardization Logo

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.

Loading...

Failed to load document history.

Publish Date Document Id Type View