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IEEE 993-1990

IEEE Standard for Test Equipment Description Language (TEDL)

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IEEE 993-1990

IEEE Standard for Test Equipment Description Language (TEDL)

PUBLISH DATE 1990

PAGES 84

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New IEEE Standard - Inactive-Withdrawn. Withdrawn Standard. Withdrawn Date: Oct 25, 1996. No longer endorsed by the IEEE. A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	993
Publication Date	June 29, 1990
Language	en - English
Page Count	84
Revision Level
Supercedes
Committee	SCC20 - Test and Diagnosis for Electronic Systems

Publish Date	Document Id	Type	View
June 19, 1997	993-1997	Revision
June 29, 1990	993-1990	Revision

SDO	Document	Title
IEEE	IEEE 716	IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
IEEE	IEEE 1671.1	IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	IEEE 1671	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 1671.2	IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE	IEEE 1671.3	IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE	IEEE 1671.4	IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
BSI	BS IEC 61671	IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
IEEE	IEEE 1076/INT	IEEE Standards Interpretations: IEEE Std 1076-1987, IEEE Standard VHDL Language Reference Manual
IEEE	IEEE 416	IEEE Standard ATLAS Test Language
IEEE	IEEE 802.16/Conformance02	IEEE Standard for Conformance to IEEE Standard 802.16 - Part 2: Test Suite Structure and Test Purposes (TSS&TP) for 10-66 GHz WirelessMAN-SC Air Interface
IEEE	IEEE 1547.1	IEEE Standard Conformance Test Procedures for Equipment Interconnecting Distributed Energy Resources with Electric Power Systems and Associated Interfaces
IEEE	IEEE 106	IEEE Standard Test procedure for Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
IEEE	IEEE 1364	IEEE Standard for Verilog Hardware Description Language
IEEE	IEEE 1666	IEEE Standard for Standard SystemC Language Reference Manual
IEEE	IEEE 2030.3	IEEE Standard Test Procedures for Electric Energy Storage Equipment and Systems for Electric Power Systems Applications
IEEE	IEEE 660	IEEE Standard for Semiconductor Memory Test Pattern Language
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
IEEE	IEEE 1901.1.1	IEEE Standard Test Procedures for IEEE Std 1901.1(TM) for Medium Frequency (less than 15 MHz) Power Line Communications for Smart Grid Applications
IEEE	IEEE 802.16/Conformance03	IEEE Standard for Conformance to IEEE Standard 802.16 - Part 3: Radio Conformance Tests (RCT) for 10-66 GHz WirelessMAN-SC Air Interface
IEEE	ANSI/IEEE 455	IEEE Standard Test Procedure for Measuring Longitudinal Balance of Telephone Equipment Operating in the Voice Band
IEEE	IEEE 1450.6.2	IEEE Standard for Memory Modeling in Core Test Language

IEEE 993-1990

IEEE Standard for Test Equipment Description Language (TEDL)

IEEE 993-1990

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