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IEEE 1450.6.1-2009

IEEE Standard for Describing On-Chip Scan Compression

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IEEE 1450.6.1-2009

IEEE Standard for Describing On-Chip Scan Compression

PUBLISH DATE 2009

PAGES 56

IEEE 1450.6.1-2009

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New IEEE Standard - Inactive-Reserved. This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	1450.6.1
Publication Date	July 13, 2009
Language	en - English
Page Count	56
Revision Level
Supercedes
Committee	Test Technology

Publish Date	Document Id	Type	View
July 13, 2009	1450.6.1-2009	Revision

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IEEE 1450.6.1-2009

IEEE Standard for Describing On-Chip Scan Compression

IEEE 1450.6.1-2009

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