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IEEE 1149.8.1-2012

Current Revision
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
Best Price Guarantee Published: Aug 9, 2012 en - English 95 Pages
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IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components

PUBLISH DATE 2012
PAGES 95
New IEEE Standard - Inactive-Reserved. Extensions to IEEE Std 1149.1 that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components are specified. Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods.
This standard specifies extensions to IEEE Std 1149.1(TM) that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.1 Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods.
The purpose of this standard is to codify testability circuitry added to an IC incremental to the testability provisions specified by IEEE Std 1149.1. This will enable selective ac stimulus generation that, when combined with non-contact signal sensing, allows testing signal paths between devices adhering to this standard and passive and/or active components.

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