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IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

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IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

PUBLISH DATE 2017

PAGES 64

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Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).

This standard is to be used as the standard definition of DATPG output formats and informational content.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	1445
Publication Date	Jan. 27, 2017
Language	en - English
Page Count	64
Revision Level
Supercedes
Committee	SCC20 - Test and Diagnosis for Electronic Systems

Publish Date	Document Id	Type	View
Jan. 27, 2017	1445-2016	Revision
March 10, 1999	1445-1998	Revision

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IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

IEEE 1445-2016

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