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BSI BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505$uT$uM

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BSI BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505$uT$uM

PUBLISH DATE 2016

PAGES 174

Document Information

Standard for the common test interface pin map configuration


SDO	BSI: British Standards Institution
Document Number	BS IEC 63003
Publication Date	Jan. 31, 2016
Language	en - English
Page Count	174
Revision Level
Supercedes
Committee

Publish Date	Document Id	Type	View
Jan. 31, 2016	BS IEC 63003:2015	Revision

SDO	Document	Title
IEEE	IEEE 1505.1	IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE	IEEE/IEC 63003	IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
IEC	IEC 63003	Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 1505	IEEE Standard for Receiver Fixture Interface
IEEE	IEEE C37.100.2	IEEE Standard for Common Requirements for Testing of AC Capacitive Current Switching Devices over 1000 V
IEEE	IEEE C37.100.1	IEEE Standard of Common Requirements for High Voltage Power Switchgear Rated Above 1000 V
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	IEEE 421B	IEEE Standard for High-Potential-Test Requirements for Excitation Systems for Synchronous Machines
IEEE	IEEE 421.3	IEEE Standard for High-Potential Test Requirements for Excitation Systems for Synchronous Machines
AMPP	NACE SP0215-IEEE Std 1839	NACE International and IEEE Joint Standard Practice for Below-Grade Corrosion Control of Transmission, Distribution, and Substation Structures by Coating Repair Systems
AMPP	NACE SP0315-IEEE Std 1835	NACE International and IEEE Joint Standard Practice for Atmospheric (Above Grade) Corrosion Control of Existing Electric Transmission, Distribution, and Substation Structures by Coating Systems
IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE	IEEE 1076/INT	IEEE Standards Interpretations: IEEE Std 1076-1987, IEEE Standard VHDL Language Reference Manual
IEEE	IEEE 488.2	IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable Instrumentation
IEEE	IEEE 1901.1.1	IEEE Standard Test Procedures for IEEE Std 1901.1(TM) for Medium Frequency (less than 15 MHz) Power Line Communications for Smart Grid Applications
IEEE	IEEE 1636.99	IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements.
AMPP	NACE SP0315-IEEE Std 1835	NACE/IEEE Joint Standard Practice for Below-Grade Inspection and Assessment of Corrosion on Steel Transmission, Distribution, and Substation Structures
IEEE	IEEE C37.34e	IEEE Standard Test Code for High-Voltage Air Switches (Supplement: Switching-Impulse Testing of Extra-High voltage Switches)
IEEE	IEEE J-STD-016	Trial-Use Standard Standard for Information Technology Software Life Cycle Processes Software Development Acquirer-Supplier Agreement
IEEE	IEEE 1003.1/2003.1	IEEE Standards Interpretations for IEEE Std 1003.1-1990 and IEEE Std 2003.1-1992 (March 1994 Edition)
IEEE	IEEE 1671.4	IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
IEEE	IEEE 1284.3	IEEE Standard for Interface and Protocol Extensions to IEEE Std 1284 Compliant Peripherals and Host Adapters

BSI BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505$uT$uM

BSI BS IEC 63003:2015

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