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SAE J1752/3 (JAN2003)

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
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SAE J1752/3 (JAN2003)

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

PUBLISH DATE 2003
PAGES 15
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SDO SAE: SAE International
Document Number J1752/3
Publication Date Jan. 21, 2003
Language en - English
Page Count 15
Revision Level 200301
Supercedes
Committee
Publish Date Document Id Type View
Sept. 22, 2017 J1752/3_201709 Revision
June 17, 2011 J1752/3_201106 Revision
Jan. 21, 2003 J1752/3_200301 Revision
March 1, 1995 J1752/3_199503 Revision