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Historical Revision

SAE J1752/2 (MAR1995)

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz_x000D_
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SAE J1752/2 (MAR1995)

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz_x000D_

PUBLISH DATE 1995
PAGES 24
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SDO SAE: SAE International
Document Number J1752/2
Publication Date March 1, 1995
Language en - English
Page Count 24
Revision Level 199503
Supercedes
Committee
Publish Date Document Id Type View
Sept. 16, 2016 J1752/2_201609 Revision
June 24, 2011 J1752/2_201106 Revision
Jan. 21, 2003 J1752/2_200301 Revision
March 1, 1995 J1752/2_199503 Revision