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SAE AS6171/11

Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
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SAE AS6171/11

Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods

PUBLISH DATE 2016
PAGES 10
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This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity. If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
SDO SAE: SAE International
Document Number AS6171/11
Publication Date Oct. 30, 2016
Language en - English
Page Count 10
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Oct. 30, 2016 AS6171/11 Revision