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JIS R 1636:1998

Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
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JIS R 1636:1998

Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer

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SDO JIS: Japanese Standards Association
Document Number JIS R 1636
Publication Date Not Available
Language en - English
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Publish Date Document Id Type View
Not Available JIS R 1636:1998 Revision