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JIS C 2170:2004

Electrostatics -- Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation
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JIS C 2170:2004

Electrostatics -- Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation

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SDO JIS: Japanese Standards Association
Document Number JIS C 2170
Publication Date Not Available
Language en - English
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Not Available JIS C 2170:2004 Revision