Logo
Login Sign Up
Current Revision

ISO 21270:2004

Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
Best Price Guarantee
Instant

$124.00

2-5 Days

$124.00

SAVE 15%

$210.80


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
International Organization for Standardization Logo

ISO 21270:2004

Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

Document Preview

ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.

SDO ISO: International Organization for Standardization
Document Number ISO 21270
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 201/SC 7
Publish Date Document Id Type View
Not Available ISO 21270:2004 Revision