Logo
Login Sign Up
Current Revision

ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
Best Price Guarantee
Instant

$81.00

2-5 Days

$81.00

SAVE 15%

$137.70


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
International Organization for Standardization Logo

ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

Document Preview

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

SDO ISO: International Organization for Standardization
Document Number ISO 18452
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 206
Publish Date Document Id Type View
Not Available ISO 18452:2005 Revision