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ISO 18117:2009

Surface chemical analysis - Handling of specimens prior to analysis
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ISO 18117:2009

Surface chemical analysis - Handling of specimens prior to analysis

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ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.

SDO ISO: International Organization for Standardization
Document Number ISO 18117
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 201/SC 2
Publish Date Document Id Type View
Not Available ISO 18117:2009 Revision