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ISO 16700:2016

Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
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ISO 16700:2016

Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

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ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

SDO ISO: International Organization for Standardization
Document Number ISO 16700
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 4
Publish Date Document Id Type View
Not Available ISO 16700:2016 Revision