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ISO 15625:2014

Silk - Electronic test method for defects and evenness of raw silk
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ISO 15625:2014

Silk - Electronic test method for defects and evenness of raw silk

ISO 15625:2014

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

SDO ISO: International Organization for Standardization
Document Number ISO 15625
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 38/SC 23
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