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ISO 14975:2000

Surface chemical analysis -- Information formats
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ISO 14975:2000

Surface chemical analysis -- Information formats

ISO 14975:2000

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

SDO ISO: International Organization for Standardization
Document Number ISO 14975
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO TC 201/SC 3/WG 1
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