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ISO/TS 24597:2011

Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
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ISO/TS 24597:2011

Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

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ISO/TS 24597:2011 specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope by means of a Fourier transform method, a contrast-to-gradient method and a derivative method.

SDO ISO: International Organization for Standardization
Document Number ISO/TS 24597
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 4
Publish Date Document Id Type View
Not Available ISO/TS 24597:2011 Revision