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ISO/TS 11888:2017

Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors
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ISO/TS 11888:2017

Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors

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ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis.

ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

SDO ISO: International Organization for Standardization
Document Number ISO/TS 11888
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 229
Publish Date Document Id Type View
Not Available ISO/TS 11888:2017 Revision