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ISO/TS 10798:2011

Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
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ISO/TS 10798:2011

Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

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ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).

SDO ISO: International Organization for Standardization
Document Number ISO/TS 10798
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 229
Publish Date Document Id Type View
Not Available ISO/TS 10798:2011 Revision