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IPC JEDEC/IPC-JP-002

JEDEC/IPC Current Tin Whiskers Theory and Mitigation Practices Guideline
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IPC JEDEC/IPC-JP-002

JEDEC/IPC Current Tin Whiskers Theory and Mitigation Practices Guideline

IPC JEDEC/IPC-JP-002
JEDEC/IPC Current Tin Whiskers Theory and Mitigation Practices Guideline
This document will provide insight into the theory behind tin whisker formation as it is known today and, based on this knowledge, potential mitigation practices that may delay the onset of, or prevent tin whisker formation. The potential effectiveness of various mitigation practices will also be briefly discussed. References behind each of the theories and mitigation practices are provided. It should be noted that for certain applications with special needs (e.g., military or aerospace), the Sn mitigation methods contained in this document may not be sufficient due to additional performance requirements. 26 pages. Released March 2006.
SDO IPC: Institute for Interconnecting and Packaging Electronic Circuits
Document Number JP002
Publication Date Not Available
Language en - English
Page Count
Revision Level 0
Supercedes
Committee
Publish Date Document Id Type View
Not Available JEDEC/IPC-JP-002 Revision