Logo
0
+1 888 608-7511
Need help finding a standard? Help Desk
Logo
Login Create Account
Logo
Create Account Login

IEEE/IEC 62860-2013

Current Revision
IEC/IEEE Test methods for the characterization of organic transistors and materials
Best Price Guarantee Published: Jul 30, 2013 en - English 28 Pages
Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
Buy Now
or
Institute of Electrical and Electronics Engineers Logo

IEC/IEEE Test methods for the characterization of organic transistors and materials

PUBLISH DATE 2013
PAGES 28
Adoption Standard - Active. Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.

Failed to load document history.

Publish Date Document Id Type View