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IEEE/IEC 61671-2012

IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEEE/IEC 61671-2012

IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

PUBLISH DATE 2012
PAGES 391
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Revision Standard - Active. This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.
This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.
SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 61671
Publication Date July 16, 2012
Language en - English
Page Count 391
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
July 16, 2012 61671-2012 Revision