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Historical Revision

IEEE C62.36-1991

IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits
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IEEE C62.36-1991

IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits

PUBLISH DATE 1992
PAGES 36
IEEE C62.36-1991
New IEEE Standard - Superseded. Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.
SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number C62.36
Publication Date Feb. 10, 1992
Language en - English
Page Count 36
Revision Level
Supercedes
Committee Surge Protective Devices/Low Voltage
Publish Date Document Id Type View
Nov. 2, 2016 C62.36-2016 Revision
July 9, 2014 C62.36-2014 Revision
Oct. 13, 2000 C62.36-2000 Revision
March 31, 1995 C62.36-1994 Revision
Feb. 10, 1992 C62.36-1991 Revision