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Historical Revision

IEEE 592-1977

IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors
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IEEE 592-1977

IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors

PUBLISH DATE 1977
PAGES 10
IEEE 592-1977
New IEEE Standard - Superseded. IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV.
SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 592
Publication Date Nov. 29, 1977
Language en - English
Page Count 10
Revision Level
Supercedes
Committee Insulated Conductors
Publish Date Document Id Type View
June 29, 2018 592-2018 Revision
May 8, 2008 592-2007 Revision
Feb. 5, 1991 592-1990 Revision
Nov. 29, 1977 592-1977 Revision