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IEEE 1671.1-2017

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
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IEEE 1671.1-2017

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

PUBLISH DATE 2018
PAGES 274
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Revision Standard - Active. An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard. A corri
This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment.
No purpose statement is required since this standard is intended for IEC standardization
SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671.1
Publication Date March 19, 2018
Language en - English
Page Count 274
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
March 19, 2018 1671.1-2017 Revision