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IEEE 1522-2004

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

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IEEE 1522-2004

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

PUBLISH DATE 2005

PAGES 35

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New IEEE Standard - Inactive-Withdrawn. This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002.

This standard defines technology independent testability and diagnosability characteristics and metrics, particularly those based on relevant standard information models including standard AI-ESTATE (IEEE 1232.1 and P1232.3) information models.

This standard will provide consistent, unambiguous definitions of testability and diagnosability characteristics and metrics. This will provide a common basis for system testability and diagnosability assessment.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	1522
Publication Date	March 23, 2005
Language	en - English
Page Count	35
Revision Level
Supercedes
Committee	SCC20 - Test and Diagnosis for Electronic Systems

Publish Date	Document Id	Type	View
March 23, 2005	1522-2004	Revision

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IEEE 1522-2004

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

IEEE 1522-2004

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