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IEEE 1226.2-1993

IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))

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IEEE 1226.2-1993

IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))

PUBLISH DATE 1994

PAGES 426

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New IEEE Standard - Inactive-Withdrawn. Ada packages that specify data types and services for the Ada-based ATLAS-level test procedure interface for a broad-based environment for test (ABBET) are defined. They are to be used to support the development of Ada- based, UUT-directed, signal-oriented test programs. IEEE ABBET uses the features of Ada to specify a comprehensive environment for integrating product design data, test requirements/strategies, and test results management in the implementation of automated test systems and test control programs.


SDO	IEEE: Institute of Electrical and Electronics Engineers
Document Number	1226.2
Publication Date	April 12, 1994
Language	en - English
Page Count	426
Revision Level
Supercedes
Committee	SCC20 - Test and Diagnosis for Electronic Systems

Publish Date	Document Id	Type	View
April 12, 1994	1226.2-1993	Revision

SDO	Document	Title
IEEE	IEEE 1226.1	IEEE ABBET(TM) Trial-Use Standard for Common Ada Packages for A Broad-Based Environment for Test (ABBET(TM))
IEEE	IEEE 1226	IEEE ABBET(TM) Trial-Use Standard for A Broad-Based Environment for Test (ABBET) Overview and Architecture
IEEE	IEEE 1226.3	IEEE Standard for Software Interface for Resource Management for a Broad Based Environment for Test (ABBET(TM))
IEEE	IEEE 1226.6	IEEE ABBET(R)- IEEE Guide for the Understanding of the "A Broad-Based Environment for Test (ABBET)(R)" Standard
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
IEEE	IEEE 106	IEEE Standard Test procedure for Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
IEEE	IEEE 1901.1.1	IEEE Standard Test Procedures for IEEE Std 1901.1(TM) for Medium Frequency (less than 15 MHz) Power Line Communications for Smart Grid Applications
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 430	IEEE Trial Use Standard Procedures for the Measurement of Radio Noise from Overhead Power Lines
IEEE	IEEE 1671.2	IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE	IEEE 262B	IEEE Trial Use Standard Dielectric Test Requirements for Power Transformers for Operation on Effectively Grounded Systems 345 kV and Above
IEEE	IEEE 309/N42.3	IEEE Standard Test Procedures and Bases for Geiger-Mueller Counters
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE C57.12.14	IEEE Trial-Use Standard for Dielectric Test Requirements for Power Transformers for Operation at System Voltages from 115 kV Through 230 kV
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	ANSI/IEEE 762	IEEE Trial use Standard Definitions for Use in Reporting Electric Generating Unit Reliability, Availability, and Productivity
IEEE	IEEE 600	IEEE Trial-Use Standard Requirements for Organizations that Conduct Qualification Testing of Safety Systems Equipment for Use in Nuclear Power Generating Stations
IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE	IEEE/IEC 62527	IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
IEEE	IEEE/IEC 62526	IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
IEEE	IEEE 1003.5	IEEE Standard for Information Technology--POSIX(TM) Ada Language Interfaces--PART 1: Binding for System Application Program Interface (API)
IEEE	IEEE 1904.1-Conformance02	IEEE Standard for Conformance Test Procedures for Service Interoperability in Ethernet Passive Optical Networks, IEEE Std 1904.1(TM) Package B
IEEE	IEEE 1904.1-Conformance03	IEEE Standard for Conformance Test Procedures for Service Interoperability in Ethernet Passive Optical Networks, IEEE Std 1904.1(TM) Package C
IEEE	IEEE 1904.1-Conformance01	IEEE Standard for Conformance Test Procedures for Service Interoperability in Ethernet Passive Optical Networks, IEEE Std 1904.1(TM) Package A
IEEE	IEEE 48	IEEE Standard for Test Procedures and Requirements for Alternating-Current Cable Terminations Used on Shielded Cables Having Laminated Insulation Rated 2.5 kV through 765 kV or Extruded Insulation Rated 2.5 kV through 500 kV

IEEE 1226.2-1993

IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))

IEEE 1226.2-1993

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