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IEEE 254
IEEE Standard Definitions of Parametric Device Terms
IEEE 254-1963

IEEE Standard Definitions of Parametric Device Terms

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IEEE 255
IEEE Standard Letter Symbols for Semiconductor Devices
IEEE 255-1963

IEEE Standard Letter Symbols for Semiconductor Devices

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IEEE 256
IEEE Test Procedure for Semiconductor Diodes
IEEE 256-1963

IEEE Test Procedure for Semiconductor Diodes

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IEEE 257
IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain
IEEE 257-1964

IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain

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IEEE 258
IEEE Test Procedure for Close-Talking Pressure-Type Microphones
IEEE 258-1965

IEEE Test Procedure for Close-Talking Pressure-Type Microphones

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IEEE 259
IEEE Proposed Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers
IEEE 259-1999

IEEE Proposed Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers

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IEEE 260
IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)
IEEE 260-1978

IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)

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IEEE 260.1
IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)
IEEE 260.1-2004

IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)

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IEEE 2600
IEEE Standard for Information Technology: Hardcopy Device and System Security
IEEE 2600-2008

IEEE Standard for Information Technology: Hardcopy Device and System Security

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IEEE 2600.1
IEEE Standard for a Protection Profile in Operational Environment A
IEEE 2600.1-2009

IEEE Standard for a Protection Profile in Operational Environment A

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IEEE 2600.2
IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment B
IEEE 2600.2-2009

IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment B

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IEEE 2600.3
IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment C
IEEE 2600.3-2009

IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment C

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IEEE 2600.4
IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600(TM)-2008 Operational Environment D
IEEE 2600.4-2010

IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600(TM)-2008 Operational Environment D

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IEEE 261
IEEE Letter Symbols for Thermoelectric Devices
IEEE 261-1965

IEEE Letter Symbols for Thermoelectric Devices

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IEEE 262B
IEEE Trial Use Standard Dielectric Test Requirements for Power Transformers for Operation on Effectively Grounded Systems 345 kV and Above
IEEE 262B-1977

IEEE Trial Use Standard Dielectric Test Requirements for Power Transformers for Operation on Effectively Grounded Systems 345 kV and Above

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IEEE 263
IEEE Standard for Measurement of Radio Noise Generated by Motor Vehicles and Affecting Mobile Communications Receivers in the Frequency Range 25-1000 megahertz
IEEE 263-1965

IEEE Standard for Measurement of Radio Noise Generated by Motor Vehicles and Affecting Mobile Communications Receivers in the Frequency Range 25-1000 megahertz

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IEEE 264
IEEE Standard for High-Power Wide-Band Transformers (100 Watts and Above)
IEEE 264-1977

IEEE Standard for High-Power Wide-Band Transformers (100 Watts and Above)

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IEEE 265
IEEE Recommended Practices for Burst Measurements in the Frequency Domain
IEEE 265-1966

IEEE Recommended Practices for Burst Measurements in the Frequency Domain

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IEEE 26513
IEEE Standard for Adoption of ISO/IEC 26513:2009 Systems and Software Engineering--Requirements for Testers and Reviewers of Documentation
IEEE 26513-2010

IEEE Standard for Adoption of ISO/IEC 26513:2009 Systems and Software Engineering--Requirements for Testers and Reviewers of Documentation

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IEEE 26514
IEEE Standard for Adoption of ISO/IEC 26514:2008 Systems and Software Engineering--Requirements for Designers and Developers of User Documentation
IEEE 26514-2010

IEEE Standard for Adoption of ISO/IEC 26514:2008 Systems and Software Engineering--Requirements for Designers and Developers of User Documentation

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IEEE 266
IEEE Test Procedure for Evaluation of Insulation Systems for Electronics Power Transformers
IEEE 266-1969

IEEE Test Procedure for Evaluation of Insulation Systems for Electronics Power Transformers

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IEEE 267
IEEE Trial-Use Recommended Practice for the Preparation and Use of Symbols
IEEE 267-1966

IEEE Trial-Use Recommended Practice for the Preparation and Use of Symbols

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IEEE 268
IEEE Standard Metric Practice
IEEE 268-1992

IEEE Standard Metric Practice

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IEEE 268A
IEEE International System of Units Conversion Factors Card
IEEE 268A-1980

IEEE International System of Units Conversion Factors Card

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IEEE 269
IEEE Standard Method for Measuring Transmission Performance of Telephone Sets
IEEE 269-2002

IEEE Standard Method for Measuring Transmission Performance of Telephone Sets

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