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BSI PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
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BSI PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format

PUBLISH DATE 2015
PAGES 68
BSI PD IEC/TR 61967-1-1:2015
definitions. Near-field scan data exchange format
SDO BSI: British Standards Institution
Document Number PD IEC/TR 61967
Publication Date Sept. 30, 2015
Language en - English
Page Count 68
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 30, 2015 PD IEC/TR 61967-1-1:2015 Revision
June 30, 2010 PD IEC/TR 61967-1-1:2010 Revision