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BSI BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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BSI BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

PUBLISH DATE 2020
PAGES 26
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Compliant materials using atomic force microscope and the two-point JKR method
SDO BSI: British Standards Institution
Document Number BS ISO 21222
Publication Date Feb. 7, 2020
Language en - English
Page Count 26
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Feb. 7, 2020 BS ISO 21222:2020 Revision