Logo
Login Sign Up
Current Revision

BSI BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Best Price Guarantee

$143.00

2-5 Days

$143.00

SAVE 10%

$257.40


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
British Standards Institution Logo

BSI BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices. Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

PUBLISH DATE 2018
PAGES 14
BSI BS IEC 62047-29:2017
Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
SDO BSI: British Standards Institution
Document Number BS IEC 62047-29
Publication Date March 15, 2018
Language en - English
Page Count 14
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
March 15, 2018 BS IEC 62047-29:2017 Revision