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BSI BS IEC 60747-14-11:2021

Semiconductor devices. Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature.
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BSI BS IEC 60747-14-11:2021

Semiconductor devices. Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature.

PUBLISH DATE 2021
PAGES 24
BSI BS IEC 60747-14-11:2021
Sensors for measuring ultraviolet, illumination and temperature.
SDO BSI: British Standards Institution
Document Number BS IEC 60747
Publication Date March 12, 2021
Language en - English
Page Count 24
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
March 12, 2021 BS IEC 60747-14-11:2021 Revision