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BSI BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices.
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BSI BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices.

PUBLISH DATE 2020
PAGES 26
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Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices.
SDO BSI: British Standards Institution
Document Number BS EN IEC 60749
Publication Date Sept. 9, 2020
Language en - English
Page Count 26
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 9, 2020 BS EN IEC 60749-41:2020 Revision