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BSI BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing.
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BSI BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing.

PUBLISH DATE 2020
PAGES 18
BSI BS EN IEC 60749-30:2020
Non-hermetic surface mount devices prior to reliability testing.
SDO BSI: British Standards Institution
Document Number BS EN IEC 60749
Publication Date Sept. 30, 2020
Language en - English
Page Count 18
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 30, 2020 BS EN IEC 60749-30:2020 Revision