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BSI BS EN IEC 60749-10:2022

Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly.
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BSI BS EN IEC 60749-10:2022

Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly.

PUBLISH DATE 2022
PAGES 16
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Mechanical shock. device and subassembly.
SDO BSI: British Standards Institution
Document Number BS EN IEC 60749
Publication Date Aug. 16, 2022
Language en - English
Page Count 16
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Aug. 16, 2022 BS EN IEC 60749-10:2022 Revision