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BSI BS EN 62374:2007

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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BSI BS EN 62374:2007

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

PUBLISH DATE 2008
PAGES 24
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DIELECTRIC FILMS
SDO BSI: British Standards Institution
Document Number BS EN 62374
Publication Date Oct. 31, 2008
Language en - English
Page Count 24
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Oct. 31, 2008 BS EN 62374:2007 Revision