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BSI BS EN 62047-3:2006

Semiconductor devices. Micro-electromechanical devices. Thin film standard test piece for tensile testing
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BSI BS EN 62047-3:2006

Semiconductor devices. Micro-electromechanical devices. Thin film standard test piece for tensile testing

PUBLISH DATE 2006
PAGES 12
Document Preview
PIECE FOR TENSILE TESTING
SDO BSI: British Standards Institution
Document Number BS EN 62047-3
Publication Date Nov. 30, 2006
Language en - English
Page Count 12
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Nov. 30, 2006 BS EN 62047-3:2006 Revision