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BSI BS EN 62047-22:2014

Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates
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BSI BS EN 62047-22:2014

Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates

PUBLISH DATE 2014
PAGES 14
BSI BS EN 62047-22:2014
Electromechanical tensile test method for conductive thin fi
SDO BSI: British Standards Institution
Document Number BS EN 62047-22
Publication Date Oct. 31, 2014
Language en - English
Page Count 14
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Oct. 31, 2014 BS EN 62047-22:2014 Revision