Logo
Login Sign Up
Current Revision

BSI BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
Best Price Guarantee

$143.00

2-5 Days

$143.00

SAVE 10%

$257.40


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
British Standards Institution Logo

BSI BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)

PUBLISH DATE 2017
PAGES 14
Document Preview
Damp heat, steady state, highly accelerated stress test (HAS
SDO BSI: British Standards Institution
Document Number BS EN 60749-4
Publication Date Nov. 28, 2017
Language en - English
Page Count 14
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Nov. 28, 2017 BS EN 60749-4:2017 Revision
Sept. 10, 2002 BS EN 60749-4:2002 Revision