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BSI BS EN 60749-4:2002

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
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BSI BS EN 60749-4:2002

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)

PUBLISH DATE 2002
PAGES 12
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ACCELERATED STRESS TEST (HAST)
SDO BSI: British Standards Institution
Document Number BS EN 60749-4
Publication Date Sept. 10, 2002
Language en - English
Page Count 12
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Nov. 28, 2017 BS EN 60749-4:2017 Revision
Sept. 10, 2002 BS EN 60749-4:2002 Revision