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BSI BS EN 60749-27:2006:2012

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
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BSI BS EN 60749-27:2006:2012

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

PUBLISH DATE 2013
PAGES 16
BSI BS EN 60749-27:2006:2012
2006 EDITION/AMENDMENT 1 INTERFILED
SDO BSI: British Standards Institution
Document Number BS EN 60749-27
Publication Date Jan. 1, 2013
Language en - English
Page Count 16
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 29, 2006 BS EN 60749-27:2006 Revision
Jan. 1, 2013 BS EN 60749-27:2006:2012 Consolidated