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Historical Revision

ASTM F676-97

Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
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1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

SDO ASTM: ASTM International
Document Number F676
Publication Date Jan. 1, 1993
Language en - English
Page Count 3
Revision Level 97
Supercedes
Committee F01.11
Publish Date Document Id Type View
Dec. 10, 1997 F0676-97R03 Revision
Jan. 1, 1993 F0676-97 Revision