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ASTM E2481-06

Historical Revision

Standard Test Method for Hot Spot Protection Testing of Photovoltaic Modules

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1.1 This test method provides a procedure to determine the ability of a photovoltaic (PV) module to endure the long-term effects of periodic "hot spot" heating associated with common fault conditions such as severely cracked or mismatched cells, single-point open circuit failures (for example, interconnect failures), partial (or non-uniform) shadowing or soiling. Such effects typically include solder melting or deterioration of the encapsulation, but in severe cases could progress to combustion of the PV module and surrounding materials.

1.2 There are two ways that cells can cause a hot spot problem; either by having a high resistance so that there is a large resistance in the circuit, or by having a low resistance area (shunt) such that there is a high-current flow in a localized region. This test method selects cells of both types to be stressed.

1.3 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number E2481
Publication Date March 1, 2006
Language en - English
Page Count 5
Revision Level 06
Supercedes
Committee E44.09
Publish Date Document Id Type View
Dec. 1, 2012 E2481-12 Revision
Nov. 1, 2008 E2481-08 Revision
March 1, 2006 E2481-06 Revision
Aug. 1, 2023 E2481-12R23 Reaffirmation
May 1, 2018 E2481-12R18 Reaffirmation